Exploiting micro-scale structural and chemical observations in real time for understanding chemical conversion: LEEM/PEEM studies over CeOx–Cu(111)

2017-11-16 | Tomáš Duchoň

Special issue of Ultramicroscopy (LEEM/PEEM-10) featuring our paper on caveats of multi length-scale characterization in model chemical conversion is live. The paper is free to access for the next 50 days through this link. micro-scale observations